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The Center for Irradiation of Materials (CIM) was established in response to the growing need for a surface modification and characterization capability in North Alabama. The newly founded center was named the Howard J. Foster Center for Irradiation of Materials (HJF-CIM) by the Board of Trustees of Alabama A&M University in the Fall of 1991. Later, the funds from National Science Foundation Renovation Program, as well as State funds, were used to renovate the space occupied by the Center. The costs for staff, operation and instrumentation of the Center have been financed from external grants and contracts totaling over $15 million won since 1989 by its director, Prof. Daryush Ila and by the Center faculty and staff.
The HJF-CIM is acknowledged to be the only one of its kind in the state of Alabama and Alabama A&M University is home for this Center. The Center for Irradiation of Materials houses the latest model 5SDH-2 Pelletron high voltage accelerator made by the National Electrostatics Corporation of Middleton, Wisconsin, a 200 kV ion implanter (NV200-6) by Eaton Corp. and a 1.7 MV Tandem IONIX system made by the High Voltage Engineering Europe at Amersfoort, The Netherlands. The two tandem accelerator systems provide a wide variety of light and heavy ion beams for MeV ion implantation, Rutherford Backscattering Spectrometry (RBS), Particle Induced X-ray Emission (PIXE) analysis, hydrogen detection and profiling capability to 0.1 ppm, MeV Focus Ion Beam (FIB) manufacturing as well as FIB probe and prototypes of new techniques for Ion Beam Analysis (IBA). Both dual source tandem machines provide protons up to 4 MeV and alpha-particles up to 6 MeV. Other heavier ions are accelerated to energies as high as 15 MeV. In addition to these two tandem systems, CIM is equipped with a 200 kV Eaton ion implanter for low energy (keV) ion implantation, a triple sputter-source Ion Beam Assisted Deposition (IBAD) system, an MeV focused ion beam line from Micro-Analytical Research Centre (University of Melbourne, Australia), an Atomic Force Microscope (AFM), a scanning micro-Raman, Fourier Transform Infra-Red ( FTIR), spectrometer, ultra violet/visible/infra red spectrometers, instrumentation for 3w thermal conductivity, Seebeck coefficient and Hall effect thin film measurements, four-point resistance and IV/CV electrical measuring systems, various spectrometers including a fully automated fluoresces spectrometer system, and an automated Rutherford Backscattering Spectrometryand Channeling station ( RBS, Model RC-43 from National Electrostatics Corporation ).
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Last modified : Wednesday, 18 June 2008