Material Characterization

- Ion Beam Modification of Materials (IBMM) & Ion Implantation
- Ion Beam Analysis (IBA)
- Fourier Transform Infra-Red Spectroscopy (FTIR)
- Scanning Micro-Raman
- Optical Photospectrometry
- Luminescence Spectrometry
- Hydrogen Detection System
- Linear and non-linear optical Properties
- Waveguiding Properties
- Lasing Properties
- Optical Figure of Merit
- Atomic Force Microscopy(AFM)
- Scanning Electron Microscopy(SEM)
- Electrical Proeperties
- Thermoelectric Property
- Auger Analysis
- Scanning Auger Microscopy (SAM)
- X-ray Photoelectron Spectroscopy (XPS/ESCA)
- Ion Scattering Spectroscopy (ISS)
- Scanning Electron Microscopy (SEM)
- Reflection High Energy Electron Diffraction (RHEED)
- Photoemission Spectroscopy (at UV level)
- Photo-Emission Electron Microscope